Semiconductor integrated circuit

ABSTRACT

A semiconductor integrated circuit includes: a first flip-flop, a combined circuit and a second flip-flop that form a critical path; a first delay circuit and a third flip-flop that are provided in the post-stage of the combined circuit; a second delay circuit and a fourth flip-flop that are provided in the post-stage of the combined circuit; a first comparison circuit that compares the output of the second flip-flop with the output of the third flip-flop; a second comparison circuit that compares the output of the second flip-flop with the output of the fourth flip-flop: and a control circuit that controls a source voltage supplied to the combined circuit in accordance with the outputs of the comparison circuits. A delay time by the first delay circuit is different from a delay time by the second delay circuit.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a semiconductor integrated circuitusing an AVS (Adaptive Voltage Scaling) technique or a DVS (DynamicVoltage Scaling) technique suitable for reducing an electric powerconsumption.

2. Description of the Related Art

Since a pace has been continuously kept for ten years or more thatimproves a degree of integration of a semiconductor to four times ashigh as that of a first year in three years, the scale of asemiconductor integrated circuit is enormously large and a method forconstructing chips of the semiconductor integrated circuit has beengreatly changed.

FIG. 15 is a block diagram showing the structure of a system LSI. InFIG. 15, a semiconductor integrated circuit 600 includes ageneral-purpose CPU 611, a DSP (Digital Signal Processor) 612, aspecial-purpose circuit 613, a special-purpose circuit 614, an SDRAM(Synchronous Dynamic TAM) control circuit 615 and a DMA (Direct MemoryAccess) controller 616. These members are mutually connected through acommon bus 617. The CPU 611 and the DSP 612 respectively have an innermemory 611 a and an inner memory 612 a in inner parts thereof. In thesemiconductor integrated circuit 500, an SDRAM 618 of a large capacityis ordinarily prepared in an external part.

Even at the present time, there is a possibility that a request forfunctions mounted on the semiconductor integrated circuit rapidlychanges every day. When a part of the functions is formed as thespecial-purpose circuit 613 or the special-purpose circuit 614 as shownin FIG. 15, such a change of the request may not be possibly rapidlymet.

Therefore, at the present stage, as shown in FIG. 16, functions mainlycomposed of a calculating function except the general-purpose CPU areformed in the structures of “multifunction DSP+an expanded function” anda specification that may possibly change is progressively met bysoftware on the multifunction DSP.

FIG. 16 is a block diagram showing such a system LSI. In FIG. 16, asemiconductor integrated circuit 700 includes a general-purpose CPU 711,a calculating function part 723 having a multifunction DSP 721 and anexpanded function 722, a calculating function part 726 having amultifunction part 724 and an expanded function 725, an SDRAM controlcircuit 715, a DMA controller 716, local buses 727 to 729 arranged inthe side of the function parts respectively, a global bus 730 arrangedin the side of the SDRAM control circuit 715 and the DMA controller 716and bus bridges 731 to 733 for connecting the local buses 727 to 729 tothe global bus 730. The multifunction DSP 721 has an inner memory 721 a.In the structures of the buses, the local buses 727 to 729 are allocatedto the function parts respectively. In the SDRAM control circuit 715side, the global bus 730 is arranged. Between the local buses 727 to 729and the global bus 730, the bus bridges 731 to 733 are arranged.

With the progress of a semiconductor process in the future, when manyfunctions are increasingly mounted on the semiconductor integratedcircuit, the structure of the semiconductor integrated circuit will befurther changed as shown in FIG. 17.

FIG. 17 is a block diagram showing another structure of a system LSI. InFIG. 17, a semiconductor integrated circuit 800 includes onegeneral-purpose CPU 811, four general purpose calculating processors 841to 844 having inner memories 841 a to 844 a, an SDRAM control circuit815, a DMA controller 816, an I/O control circuit 845 for controlling aperipheral I/O group 860, a local bus 846 arranged in the side of theCPU 811 and the 1/0 control circuit 845, local buses 847 to 850 arrangedin the side of the general-purpose calculating processors 841 to 844, aglobal bus 851 arranged between the local bus 846 and the local buses847 to 850, bus bridges 852 to 855 for connecting the local buses 847 to850 to the global bus 851 and a bus bridge 856 for connecting the localbus 846 to the global bus 851.

In the semiconductor integrated circuit 800, the one general-purpose CPU811 and several (four to eight or so) general-purpose calculatingprocessors 841 to 844 are connected together through the local buses 846to 850, the global bus 851 and the bus bridges 852 to 856. An SDRAM 818of a large capacity is arranged in an external part. The SDRAM controlcircuit 815 adjusts the general-purpose CPU 811, the several calculatingprocessors 841 to 844 and the DMA controller 816 or the like relative tothe SDRAM 818.

As described above, when the degree of integration of the semiconductorintegrated circuit is enhanced, a problem of a consumed electric powerarises that increases during an operation or a stand-by as the mostserious problem. As a method for solving this problem, there is a DVS(Dynamic Voltage Scaling) technique or an AVS (Adaptive Voltage Scaling)technique as the technique that most attracts an attention. Since thecontents of these techniques are described in detail in below-describeddocuments (for instance, Patent Documents 1 and 2 and Non-PatentDocuments 1 and 2), an explanation thereof will be omitted.

However, the above-described usual semiconductor integrated circuitshave problems as described below.

According to the Non-Patent Document 1, the AVS technique has a greatrestricted matter under existing circumstances. The present AVStechnique is adopted on the assumption that this technique is used forall chips. In this case, all the chips change source voltages and systemclock frequencies corresponding thereto at the same time. Namely, inthis system, the source voltages of the chips and the system clockfrequencies change on the basis of a time base, and the CPU controls thesource voltage of the chip to be raised (for instance, VDD=1.5 V) andthe system clock frequency to be also raised (for instance, fclk=400MHz) when an amount of a load of a work is large. Further, when anamount of a load of the work is small, the CPU controls the sourcevoltage of the chip to be lowered (for instance, VDD=1.0 V) and thesystem clock frequency to be also lowered (for instance, fclk=200 MHz).In such a way, the electric power consumed in the chips can be reduced.Ordinarily, in the system LSI, various kinds of functional blocks suchas a video signal processing block, an audio signal processing block, acontrol signal processing block or the like are provided and a largedifference exists in an amount of a load of a work required for aprocess between these functional blocks.

As a related art that tries to solve the above-described problem, theNon-Patent Document 2 is exemplified. Here, the source voltage of theaudio signal processing block can be selected from 0.9 V/1.2 V and thesystem clock frequency can be selected from 90 MHz/180 MHz, however, forother blocks than the audio signal processing block (here, the videosignal processing block or the like is provided), the source voltage isfixed to 1.2 V and the system clock frequency is fixed to 180 MHz.

In accordance with the above-description, in the functional blocksrespectively, to what source voltage the source voltage is set and towhat operating frequency the frequency is set correspondingly to thecontents of the works respectively for a multifunction DSP aredetermined in accordance with a previous minute and careful simulation.However, when the inner circuit of each block of the multifunction DSPis investigated, various delay paths exist in the circuit. The value ofthe source voltage necessary for executing a specific work in themultifunction DSP is determined by a group of delay paths called as acritical path among the various delay paths existing in the functionalblock. Assuming that the operating frequency is constant while a certainwork is carried out, the source voltage value needs to have a margin inorder to provide a margin for the operation of the multifunction DSP.

When the consumed electric power of the multifunction DSP is tried to bereduced, the source voltage value of the multifunction DSP to be set maybe set to the lowest value that can pass at all costs the critical pathwhose delay value is the largest. However, it is very difficult todetermine such a subtle setting even by a previous minute and carefulsimulation.

As a usual technique for realizing the delicate setting of the sourcevoltage value, a canary flip-flop shown in FIG. 18 that is disclosed inPatent Document 3 is devised. In FIG. 18, a signal 901 initiallysynchronizes with a clock signal 902 and is taken into a flip-flop 903.In a next clock period, the signal is delayed by a combined circuit 904and then taken into a flip-flop 905 (refer it to as a “main FF 905”,hereinafter.). A signal obtained by delaying the signal that is delayedby the combined circuit 904 by a specific time by a delay element 907 istaken to a flop-flop 908 (refer it to as a “canary FF 908”,hereinafter.). The signal from the main FF 905 is compared with thesignal from the canary FF 908 by a comparison circuit 909 formed with anExclusive-OR circuit. When values held by the main FF 905 and the canaryFF 908 are different from each other, this indicates that when thesignal 901 is delayed by a delay value of the delay element 907 from apresent state, the signal 901 generates a malfunction. That is, a timingerror can be anticipated in accordance with the structure of the canaryFF. When an output of the comparison circuit 909 is “1” by the delayvalue of the delay element 907 corresponding to a necessary margin, thisindicates that a sufficient margin is not provided for the sourcevoltage value of the block of the multifunction DSP from the viewpointof the margin. Therefore, a control needs to be carried out so as toraise the source voltage value VDD 950 of the block of the multifunctionDSP.

Patent Document 1: U.S. Pat. No. 5,745,375

Patent Document 2: U.S. Pat. No. 6,868,503

Patent Document 3: JP-A-2006-60086

Patent Document 4: JP-A-2007-249308

Non-Patent Document 1: “A Combined Hardware-Software Approach forLow-Power SoC: Applying Adaptive Voltage Scaling and Intelligent Energymanagement Software”, Design 2003 (System-on-Chip and ASIC DesignConference)

Non-Patent Document 2: “An H. 264/MPEG-4 Audio/Visual Codec LSI withModule-Wise Dynamic Voltage/Frequency Scaling”, ISSCC2005 Dig. Tech,Papers, pp. 132-133

Non-Patent Document 3: T. Sato and Y Kunitake “A Simple Flip-FlopCircuit for Typical-Case Designs for DFM” 8 th International Symposiumon Quality Electronic Design, 2007

The control of the multifunctional DSP block using the above-describedcanary FF is an effective method for setting the source voltage valuethat can be hardly determined by a previous minute and carefulsimulation, however, this method has below-described problems.

(1) Problem 1

In the Non-Patent Document 3, when the output of the comparison circuit909 is “1”, this indicates that a sufficient margin is not provided forthe source voltage value of the block of the multifunction DSP.Therefore, such a control is carried out as to raise the source voltagevalue VDD 950 of the block of the multifunction DSP. In the Non-PatentDocument 3, the source voltage of the entire part of the block of themultifunction DSP is raised. Accordingly, the source voltages of most ofcircuits that are not the critical path are also raised, which is notpreferable in view of the reduction of the consumed electric power ofthe semiconductor integrated circuit.

(2) Problem 2

In the structure for controlling the source voltage value of the blockof the multifunction DSP using the canary FF disclosed in the Non-patentDocument 3, even when the margin of the critical path is desired to beset to a value between 10% and 20%, it cannot be realized.

As described above, in controlling the source voltage value of the blockof the multifunction DSP using the canary FF, the two large problems asmentioned above arise.

SUMMARY OF THE INVENTION

It is an object of the present invention to provide a semiconductorintegrated circuit that realizes an AVS (Adaptive Voltage Scaling)technique or a DVS (Dynamic Voltage Scaling) technique suitable forreducing a consumed electric power.

The present invention provides a semiconductor integrated circuit havinga critical path. The semiconductor integrated circuit comprises: a firstflip-flop, a combined circuit and a second flip-flop that are connectedin series and form the critical path; a first delay circuit and a thirdflip-flop connected in series that are provided in parallel with thesecond flip-flop in the post-stage of the combined circuit; a seconddelay circuit and a fourth flip-flop connected in series that areprovided in parallel with the second flip-flop in the post-stage of thecombined circuit; a first comparison circuit that compares the output ofthe second flip-flop with the output of the third flip-flop; a secondcomparison circuit that compares the output of the second flip-flop withthe output of the fourth flip-flop: and a control circuit that controlsa source voltage supplied to the combined circuit in accordance with theoutput of the first comparison circuit and the output of the secondcomparison circuit, wherein the first delay circuit outputs a signalinputted from the combined circuit after a first delay time and thesecond delay circuit outputs a signal inputted from the combined circuitafter a second delay time different from the first delay time.

In the semiconductor integrated circuit, the first delay time is a value5% to 30% as long as a delay time from the first flip-flop to the secondflip-flop.

In the semiconductor integrated circuit, the second delay time is avalue 105% to 130% as long as the first delay time.

In the semiconductor integrated circuit, when the output of the firstcomparison circuit shows a “mismatch” of two input signals and theoutput of the second comparison circuit shows a “mismatch” of two inputsignals, the control circuit controls the source voltage supplied to thecombined circuit to be raised.

In the semiconductor integrated circuit, when the output of the firstcomparison circuit shows a “match” of the two input signals and theoutput of the second comparison circuit shows a “mismatch” of the twoinput signals, the control circuit controls the source voltage suppliedto the combined circuit to be held.

In the semiconductor integrated circuit, when the output of the firstcomparison circuit shows a “match” of the two input signals and theoutput of the second comparison circuit shows a “match” of the two inputsignals, the control circuit controls the source voltage supplied to thecombined circuit to be lowered.

In the semiconductor integrated circuit, an equal source voltage issupplied to the first flip-flop and the second flip flop and the sourcevoltage is lower than the source voltage supplied to the combinedcircuit.

In the semiconductor integrated circuit, the control circuit controlsthe source voltage supplied to the combined circuit to be “raised”,“held” or “lowered”.

In the semiconductor integrated circuit, the control circuit sets theinitialization of the source voltage supplied to the combined circuit tobe “held”.

The semiconductor integrated circuit further comprises: a third delaycircuit and a fifth flip-flop connected in series that are provided inparallel with the second flip-flop in the post-stage of the combinedcircuit; a fourth delay circuit and a sixth flip-flop connected inseries that are provided in parallel with the second flip-flop in thepost-stage of the combined circuit; a third comparison circuit thatcompares the output of the second flip-flop with the output of the fifthflip-flop; and a fourth comparison circuit that compares the output ofthe second flip-flop with the output of the sixth flip-flop. The controlcircuit controls the source voltage supplied to the combined circuit inaccordance with the output of the first comparison circuit, the outputof the second comparison circuit, the output of the third comparisoncircuit and the output of the fourth comparison circuit and the firstdelay time, the second delay time, a third delay time by the third delaycircuit and a fourth delay time by the fourth delay circuit arerespectively different.

According to the present invention, the semiconductor integrated circuitcan realize the DVS (Dynamic Voltage Scaling) technique or the AVS(Adaptive Voltage Scaling) technique in an optimum form and moreeffectively reduce a consumed electric power.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram showing the structure of a semiconductorintegrated circuit according to a first embodiment of the presentinvention.

FIG. 2 is a block diagram showing the structure of a semiconductorintegrated circuit according to a second embodiment of the presentinvention.

FIG. 3 is a block diagram showing how the source voltage value VDDH of acombined circuit 104 forming a critical path is changed in a structurehaving four canary FFs.

FIG. 4 is a block diagram when the first embodiment or the secondembodiment is applied to the semiconductor integrated circuit on which aDVFS (Dynamic Voltage and Frequency Scaling) mechanism is mounted.

FIG. 5 is a diagram showing a connection of a first inner memory 412 ina first functional block 410.

FIG. 6 is a diagram showing a connection of an inner memory in a secondfunctional block of a semiconductor integrated circuit according to athird embodiment

FIG. 7 is a diagram showing a dependence of the work volume of thesecond functional block 420 and the source voltage (operating frequency)of the second functional block 420 on the elapse of time.

FIG. 8 is a diagram showing a dependence of the work volume of the firstfunctional block 410 and the source voltage (operating frequency) of thefirst functional block 410 on the elapse of time.

FIG. 9 is a block diagram showing the structure of a second clockgenerating circuit 421 in the second functional block 420.

FIG. 10 is a block diagram showing the structure of a first clockgenerating circuit 411 in the first functional block 410.

FIG. 11 is a diagram showing the path delay of a delay path and a countnumber.

FIG. 12 is a circuit diagram for selecting three stages of voltages of asource voltage value VDDH-lowlow, a source voltage value VDDH-low and asource voltage value VDDH-normal when a degree of delay of a criticalpath is low.

FIG. 13 is a circuit diagram for selecting three stages of voltages of asource voltage value VDDH-low, a source voltage value VDDH-normal and asource voltage value VDDH-high when a degree of delay of the criticalpath is intermediate.

FIG. 14 is a circuit diagram for selecting three stages of voltages of asource voltage value VDDH-normal, a source voltage value VDDH-high and asource voltage value VDDH-highhigh when a degree of delay of thecritical path is intermediate.

FIG. 15 is a block diagram of a usual system LSI.

FIG. 16 is a block diagram of a usual system LSI.

FIG. 17 is a block diagram of a usual system LSI.

FIG. 18 is a block diagram showing that a circuit diagram of a canary FFis applied to a usual critical path.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

Now, embodiments of the present invention will be described below byreferring to the drawings.

First Embodiment

FIG. 1 is a diagram showing the structure of a semiconductor integratedcircuit according to a first embodiment of the present invention. Asshown in FIG. 1, the semiconductor integrated circuit of this embodimentincludes two canary FFs 108 and 112.

In FIG. 1, a signal 101 is initially synchronized with a clock signal102 and taken to a flip-flop 103. In a next clock period, the signal isdelayed by a level shifter 152 for converting a voltage level betweendifferent voltages and a combined circuit 104, and then taken to aflop-flop 105 (refer it to as a “main FF 105” hereinafter.). A signalobtained by delaying the signal that is delayed by the level shifter 152and the combined circuit 104 by a specific delay time T1 by a firstdelay element 107 is taken to a flip-flop 108 (refer it to as a “firstcanary FF 108” hereinafter.). The signal from the main FF 105 iscompared with the signal from the first canary FF 108 by a firstExclusive-OR (mismatch circuit) 109. A compared result is outputted as acompared result signal 110.

Further, a signal obtained by delaying the signal that is delayed by thelevel shifter 152 and the combined circuit 104 by a specific delay timeT2 by a second delay element 111 is taken to a flip-flop 112 (refer itto as a “second canary FF 112” hereinafter.). The signal from the mainFF 105 is compared with the signal from the second canary FF 112 by asecond Exclusive-OR (mismatch circuit) 113. A compared result isoutputted as a compared result signal 114.

Here, the specific delay time T1 by the first delay element 107 is setto a value 10% as long as a delay time from the flip flop 103 to theflip-flop 105 and the specific delay time T2 by the second delay element111 is set to a value 20% as long as the delay time from the flip-flop103 to the flip-flop 105.

When the specific delay time Ti and the specific delay time T2 are setin such a way, a source voltage value VDDH supplied to the level shifter152 and the combined circuit 104 is controlled as illustrated in abelow-shown Table 1 in accordance with the combination of the value ofthe compared result signal 110 and the value of the compared resultsignal 114. In FIG. 1, the source voltage value VDDH supplied to thelevel shifter 152 and the combined circuit 104 is set to a voltage valuehigher than a source voltage value VDDL supplied to other parts than thecombined circuit 104.

In the Table 1, a case represented by X is not ordinarily present. Thatis, the case that the value of the compared result signal 110 is “1” andthe value of the compared result signal 114 is “0” is not ordinarilypresent.

TABLE 1 Value of compared Value of compared result signal 110 “1” resultsignal 110 “0” Value of compared Raise source voltage Hold sourcevoltage result signal 114 “1” value VDDH (1) value VDDH (2) Value ofcompared X Lower source voltage result signal 114 “0” value VDDH (3)

A method for controlling the source voltage value VDDH in accordancewith the combination of the value of the compared result signal 110 andthe value of the compared result signal 114 can be summarized asdescribed below. A table according to this method is shown in Table 2.

In the Case of (1):

When the value of the compared result signal 110 is “1” and the value ofthe compared result signal 114 is “1”, that is, when the source voltagevalue VDDH cannot pass even a margin of 10%, since a real margin is lessthan 10%, the source voltage value VDDH is controlled to be raised. As aresult, the real margin is increased.

In the Case of (2):

When the value of the compared result signal 110 is “0” and the value ofthe compared result signal 114 is “1”, that is, when the source voltagevalue VDDH can pass the margin of 10%, however, the source voltage VDDHcannot pass a margin of 20%, since a real margin is 10% or more and 20%or less, the source voltage value VDDH is controlled to be held.

In the Case of (3):

When the value of the compared result signal 110 is “0” and the value ofthe compared result signal 114 is “0”, that is, when the source voltagevalue VDDH can pass even a margin of 20%, since a real margin is morethan 20%, the source voltage value VDDH is controlled to be lowered. Asa result, the real margin is decreased.

TABLE 2 Value of Value of compared result compared result Contents ofsignal 110 signal 114 control In the case of “1” “1” Raise source (1)voltage value VDDH In the case of “0” “1” Hold source (2) voltage valueVDDH In the case of “0” “0” Lower source (3) voltage value VDDH

The source voltage value VDDH supplied to the level shifter 152 and thecombined circuit 104 is controlled as shown in the Table 1 and the Table2 in accordance with the combination of the value of the compared resultsignal 110 and the value of the compared result signal 114. Thus, themargin of a critical path can be set to a value ranging from 10% to 20%.

This structure is applied respectively to critical paths so that all thecritical paths can be individually met. Thus, the problem 2 is solved.

As can be understood from a circuit diagram shown in FIG. 1, in order toensure the margin of the delay time, a circuit structure is provided inwhich only the source voltage value VDDH of the combined circuit 104forming the critical path is raised without raising the source voltageof the entire part of a block of a multifunction DSP. Therefore, thesource voltage value of a delay path that does not form the criticalpath is set to the source voltage value VDDL lower than the sourcevoltage value VDDH. Accordingly, since the source voltages of most ofthe circuits that are not the critical path are not raised, this ispreferable in view of reducing a consumed electric power. Thus, theproblem 1 is also solved.

As mentioned above, the case that there are two canary FFs including thefirst canary FF 108 and the second canary 112 is explained. However,when a structure having four canary FFs is formed, the margin of thecritical path can be more finely set by taking a step forward, ascompared with the structure having the two canary FFs in which themargin of the critical path can be merely set to a value ranging from10% to 20%. Accordingly, a consumed electric power can be more reduced.

Second Embodiment

FIG. 2 is a diagram showing the structure of a semiconductor integratedcircuit according to a second embodiment of the present invention. Asshown in FIG. 2, the semiconductor integrated circuit of this embodimentincludes four canary FFs 108, 112, 116 and 120.

In FIG. 2, a signal 101 is initially synchronized with a clock signal102 and taken to a flip-flop 103. In a next clock period, the signal isdelayed by a level shifter 152 and a combined circuit 104, and thentaken to a flop-flop 105 (refer it to as a “main FF 105” hereinafter.).A signal obtained by delaying the signal that is delayed by the levelshifter 152 and the combined circuit 104 by a specific delay time TT1 bya first delay element 107 is taken to a flip-flop 108 (refer it to as a“first canary FF 108” hereinafter.). The signal from the main FF 105 iscompared with the signal from the first canary FF 108 by a firstExclusive-OR (mismatch circuit) 109. A compared result is outputted as acompared result signal 110.

Further, a signal obtained by delaying the signal that is delayed by thelevel shifter 152 and the combined circuit 104 by a specific delay timeTT2 by a second delay element 111 is taken to a flip-flop 112 (refer itto as a “second canary FF 112” hereinafter.). The signal from the mainFF 105 is compared with the signal from the second canary FF 112 by asecond Exclusive-OR (mismatch circuit) 113. A compared result isoutputted as a compared result signal 114.

Further, a signal obtained by delaying the signal that is delayed by thelevel shifter 152 and the combined circuit 104 by a specific delay timeTT3 by a third delay element 115 is taken to a flip-flop 116 (refer itto as a “third canary FF 116” hereinafter.). The signal from the main FF105 is compared with the signal from the third canary FF 116 by a thirdExclusive-OR (mismatch circuit) 117. A compared result is outputted as acompared result signal 118.

Further, a signal obtained by delaying the signal that is delayed by thelevel shifter 152 and the combined circuit 104 by a specific delay timeTT4 by a fourth delay element 119 is taken to a flip-flop 120 (refer itto as a “fourth canary FF 120” hereinafter.). The signal from the mainFF 105 is compared with the signal from the fourth canary FF 120 by afourth Exclusive-OR (mismatch circuit) 121. A compared result isoutputted as a compared result signal 122.

Here, the specific delay time TT1 by the first delay element 107 is setto a value 5% as long as a delay time from the flip flop 103 to theflip-flop 105 and the specific delay time TT2 by the second delayelement 111 is set to a value 10% as long as the delay time from theflip-flop 103 to the flip-flop 105. The specific delay time TT3 by thethird delay element 115 is set to a value 15% as long as a delay timefrom the flip flop 103 to the flip-flop 105 and the specific delay timeTT4 by the fourth delay element 119 is set to a value 20% as long as thedelay time from the flip-flop 103 to the flip-flop 105.

When the specific delay time TT1, the specific delay time TT2, thespecific delay time TT3 and the specific delay time TT4 are set in sucha way, a source voltage value VDDH supplied to the level shifter 152 andthe combined circuit 104 is controlled as illustrated in a below-shownTable 3 in accordance with the combination of the value of the comparedresult signal 110, the value of the compared result signal 114, thevalue of the compared result signal 118 and the value of the comparedresult signal 122. In FIG. 2, the source voltage value VDDH supplied tothe level shifter 152 and the combined circuit 104 is set to a voltagevalue higher than a source voltage value VDDL supplied to other partsthan the combined circuit 104.

In the Table 3, a case represented by X is not ordinarily present. Asshown in the Table 3, four cases are not ordinarily present.

TABLE 3 Value of Value of Value of Value of compared compared comparedcompared result signal result signal result signal result signal 110 “1”and 110 “0”and 110 “0”and 110 “0”and value of value of value of value ofcompared compared compared compared result signal result signal resultsignal result signal 114 “1” 114 “1” 114 “1” 114 “0” Value of RaiseRaise X Hold source compared source source voltage result signal voltagevoltage value VDDH 118 “1” and value VDDH value VDDH (3) value of (1)(2) compared result signal 122 “1” Value of X X X Lower compared sourceresult signal voltage 118 “0” and value VDDH value of (4) comparedresult signal 122 “1” Value of X X X X compared result signal 118 “1”and value of compared result signal 122 “0” Value of X X X Lowercompared source result signal voltage 118 “0” and value (5) value ofcompared result signal 122 “0”

A method for controlling the source voltage value VDDH in accordancewith the combination of the value of the compared result signal 110, thevalue of the compared result signal 114, the value of the comparedresult signal 118 and the value of the compared result signal 122 can besummarized as described below. A table according to this method is shownin Table 4.

In the Case of (1):

When the value of the compared result signal 110 is “1”, the value ofthe compared result signal 114 is “1”, the value of the compared resultsignal 118 is “1” and the value of the compared result signal 122 is“1”, that is, when the source voltage value VDDH fails even for a marginof 5%, since a real margin is less than 5%, the source voltage valueVDDH is controlled to be raised. As a result, the real margin isincreased.

In the Case of (2):

When the value of the compared result signal 110 is “0”, the value ofthe compared result signal 114 is “1”, the compared result signal 118 is“1” and the value of the compared result signal 122 is “1”, that is,when the source voltage value VDDH can pass only the margin of 5%, sincea real margin is 5% or more and 10% or less, the source voltage valueVDDH is controlled to be raised. As a result, the real margin isincreased.

In the Case of (3):

When the value of the compared result signal 110 is “0”, the value ofthe compared result signal 114 is “0”, the value of the compared resultsignal 118 is “1” and the value of the compared result signal 122 is“1”, that is, when the source voltage value VDDH can pass only themargin of 10% or less, since a real margin is 10% or more and 15% orless, the source voltage value VDDH is controlled to be held.

In the Case of (4)

When the value of the compared result signal 110 is “0”, the value ofthe compared result signal 114 is “0”, the value of the compared resultsignal 118 is “0” and the value of the compared result signal 122 is“1”, that is, when the source voltage value VDDH can pass only themargin of 15% or less, since a real margin is 15% or more and 20% orless, the source voltage value VDDH is controlled to be lowered. As aresult, the real margin is decreased.

In the Case of (5)

When the value of the compared result signal 110 is “0”, the value ofthe compared result signal 114 is “0”, the value of the compared resultsignal 118 is “0” and the value of the compared result signal 122 is“0”, that is, when the source voltage value VDDH can pass the margin of20% or less, since a real margin is 20% or more, the source voltagevalue VDDH is controlled to be lowered. As a result, the real margin isdecreased.

TABLE 4 Value of Value of Value of Value of compared compared comparedcompared result result result result Con-tents signal 112 signal 114signal 118 signal 122 of control In the “1” “1” “1” “1” Raise case ofsource (1) voltage value VDDH In the “0” “1” “1” “1” Raise case ofsource (2) voltage value VDDH In the “0” “0” “1” “1” Hold case of source(3) voltage value VDDH In the “0” “0” “0” “1” Lower case of source (4)voltage value VDDH In the “0” “0” “0” “0” Lower case of source (5)voltage value VDDH

The source voltage value VDDH supplied to the level shifter 152 and thecombined circuit 104 is controlled as shown in the Table 3 and the Table4 in accordance with the combination of the value of the compared resultsignal 110, the value of the compared result signal 114, the value ofthe compared result signal 114, the value of the compared result signal118 and the value of the compared result signal 122. Thus, the margin ofa critical path can be set to a value ranging from 10% to 15%.

This structure is applied respectively to critical paths so that all thecritical paths can be individually met. Thus, the problem 2 is solvedmore accurately than the first embodiment.

As can be understood from a circuit diagram shown in FIG. 2, in order toensure the margin of the delay time in the second embodiment as in thefirst embodiment shown in FIG. 1, a circuit structure is provided inwhich only the source voltage value VDDH of the combined circuit 104forming the critical path is raised without raising the source voltageof the entire part of a block of a multifunction DSP. Therefore, thesource voltage value of a delay path that does not form the criticalpath is set to the source voltage value VDDL lower than the sourcevoltage value VDDH. Accordingly, since the source voltages of most ofthe circuits that are not the critical path are not raised, this ispreferable in view of reducing a consumed electric power. Thus, theproblem 1 is also solved.

FIG. 3 is a block diagram showing how the source voltage value VDDH of acombined circuit 104 that forms a critical path is changed in the caseof a structure having four canary FFs. In FIG. 3, since membersdesignated by the same reference numerals as those of FIG. 2 carry outthe same operations as those described in FIG. 2, an explanation thereofwill be omitted.

Reference numeral 201 designates a power cable for supplying a sourcevoltage value VDDL. Reference numerals 202, 203, 204, 205 and 206respectively show power cables for supplying a source voltage valueVDDH-lowlow, a source voltage value VDDH-low, a source voltage valueVDDH-normal, a source voltage value VDDH-high and a source voltage valueVDDH-highhigh. Reference numeral 208 designates a control circuit suchas a CPU for controlling a switch part 207 for switching a sourcevoltage value VDDH supplied to a level shifter 152 and a combinedcircuit 104 in accordance with the combination of the value of acompared result signal 110, the value of a compared result signal 114,the value of a compared result signal 118 and the value of a comparedresult signal 122 as shown in the Table 3 and the Table 4.

Third Embodiment

FIG. 4 is a circuit block diagram showing a structure obtained when thefirst embodiment or the second embodiment is applied to a semiconductorintegrated circuit on which a DVFS (Dynamic Voltage and FrequencyScaling) mechanism is specifically mounted. Initially, the semiconductorintegrated circuit 300 on which the DVFS (Dynamic Voltage and FrequencyScaling) mechanism is mounted will be described in detail. Then, amethod for applying the present invention to the semiconductorintegrated circuit on which the DVFS (Dynamic Voltage and FrequencyScaling) mechanism is mounted will be described.

In FIG. 4, the semiconductor integrated circuit 300 includes a firstfunctional block 410 supposed to be a general-purpose CPU, a secondfunctional block 420, a third functional block 430, a fourth functionalblock 440, a fifth functional block 450, an SDRAM control circuit 331for controlling an SDRAM 330, a DMA controller 332, an I/O controlcircuit 334 for controlling a group of peripheral I/Os 333, a local bus461 arranged in the side of the first functional block 410 and the I/Ocontrol circuit 334, a local bus 462 arranged in the second functionalblock 420 side, a local bus 463 arranged in the third functional block430 side, a local bus 464 arranged in the fourth functional block 440side, a local bus 465 arranged in the fifth functional block 450 side, aglobal bus 466 arranged between the local bus 461 and the local buses462 to 465, a bus bridge 471 for connecting the local bus 461 to theglobal bus 466, a bus bridge 472 for connecting the local bus 462 to theglobal bus 466, a bus bridge 473 for connecting the local bus 463 to theglobal bus 466, a bus bridge 474 for connecting the local bus 464 to theglobal bus 466, a bus bridge 475 for connecting the local bus 465 to theglobal bus 466, a clock generating circuit 352 for generatingsequentially multiplied clocks on the basis of an externally inputtedclock 351 and a power regulator 481 for supplying a prescribed power toparts respectively on the basis of an external power source 480.

The first functional block 410 includes a first clock generating circuit411 for generating a first system clock (f_(CLK) 1) 414, a first innermemory 412 and a selector 413 for selecting any clock of the firstsystem clock (f_(CLK) 1) 414, a second system clock (f_(CLK) 2) 424, athird system clock (f_(CLK) 3) 434, a fourth system clock (f_(CLK) 4)444 and a fifth system clock (f_(CLK) 5) 454 and supplying the systemclock to the first inner memory 412.

Further, the second functional block 420 includes a second clockgenerating circuit 421 for generating the second system clock (f_(CLK)2) 424, a second inner memory 422 and a selector 423 for selecting anyclock of the first system clock (f_(CLK) 1) 414, the second system clock(f_(CLK) 2) 424, the third system clock (f_(CLK) 3) 434, the fourthsystem clock (f_(CLK) 4) 444 and the fifth system clock (f_(CLK) 5) 454and supplying the system clock to the second inner memory 422.

The third functional block 430, the fourth functional block 440 and thefifth functional block 450 are constructed similarly to the firstfunctional block 410 and the second functional block 420.

The clock generating circuit 352 generates a system clock 353 andsupplies the generated system clock 353 respectively to the first clockgenerating circuit 411 in the first functional block 410, the secondclock generating circuit 421 in the second functional block 420, a thirdclock generating circuit 431 in the third functional block 430, a fourthclock generating circuit 441 in the fourth functional block 440, a fifthclock generating circuit 451 in the fifth functional block 450, theSDRAM control circuit 331 and the DMA controller 332.

The first system clock (f_(CLK) 1) 414 supplied to a circuit in thefirst functional block 410 is generated in the first clock generatingcircuit 411 provided in the first functional block 410. The secondsystem clock (f_(CLK) 2) 424 supplied to a circuit in the secondfunctional block 420 is generated in the second clock generating circuit421 provided in the second functional block 420. The third system clock(f_(CLK) 3) 434 supplied to a circuit in the third functional block 430is generated in the third clock generating circuit 431 provided in thethird functional block 430. The fourth system clock (f_(CLK) 4) 444supplied to a circuit in the fourth functional block 440 is generated inthe fourth clock generating circuit 441 provided in the fourthfunctional block 440. The fifth system clock (f_(CLK) 5) 454 supplied toa circuit in the fifth functional block 450 is generated in the fifthclock generating circuit 451 provided in the fifth functional block 450.

Though not shown in FIG. 4, the first system clock 414 generated in thefirst clock generating circuit 411 in the first functional block 410 issupplied not only to the selector 413, but also to the selectors 423 to453 provided in the second to the fifth functional blocks 420 to 450.This is the same for other system clocks.

The power regulator 481 wires a power cable 482 to the first functionalblock 410, a power cable 483 to the second functional block 420, a powercable 484 to the third functional block 430, a power cable 485 to thefourth functional block 440 and a power cable 486 to the fifthfunctional block 450, respectively.

In this embodiment, the association of an entire flow control isdescribed on a main program stored in the inner memory 412 provided inthe first functional block 410 supposed to be the general-purpose CPU.Processes related to an AV requiring a throughput are described onsub-programs stored in inner memories 422 to 452 provided in the secondto the fifth functional blocks supposed to be multifunction DSPs. Inthis sense, it is the first functional block 410 supposed to be thegeneral-purpose CPU that manages the entire work of the semiconductorintegrated circuit 300.

Now, an operation of the semiconductor integrated circuit 300constructed as described above will be described below.

In the first clock generating circuit 411 in the first functional block410, the first system clock 414 is generated that is necessary forcarrying out a calculation in which the throughput of the firstfunctional block 410 changes depending on a time on the basis of thesystem clock 353 supplied to the semiconductor integrated circuit 300 byusing an inner PLL circuit.

Similarly, in the second clock generating circuit 421 in the secondfunctional block 420, the second system clock 424 is generated that isnecessary for carrying out a calculation in which the throughput of thesecond functional block 420 changes depending on a time. In the thirdclock generating circuit 431 in the third functional block 430, thethird system clock 434 is generated that is necessary for carrying out acalculation in which the throughput of the third functional block 430changes depending on a time. Further, in the fourth clock generatingcircuit 441 in the fourth functional block 440, the fourth system clock444 is generated that is necessary for carrying out a calculation inwhich the throughput of the fourth functional block 440 changesdepending on a time. In the fifth clock generating circuit 451 in thefifth functional block 450, the fifth system clock 454 is generated thatis necessary for carrying out a calculation in which the throughput ofthe fifth block 450 changes depending on a time.

The first functional block 410 as the general-purpose CPU has the innermemory 412 of a large capacity. A scheduler (not shown in the drawing)in the functional block 410 as the general-purpose CPU generallycontrols the operation of the entire part of the semiconductorintegrated circuit 300. The scheduler is specifically realized byexecuting the main program by the general-purpose CPU.

The first functional block 410 includes below-described information inthe inner memory 412 in order to execute the main program and generallycontrol the operation of the entire part of the semiconductor integratedcircuit 300. Namely, the inner memory 412 of the first functional block410 includes information concerning from what time, with what ability todo a work and what work volume of the work the second functional block420 needs to carry out, at which frequency the second functional block420 needs to operate for that purpose, and at which source voltage asource voltage needs to be set for the second functional block 420 tooperate at that operating frequency, information concerning from whattime, with what ability to do a work and what work volume of the workthe third functional block 430 needs to carry out, at which frequencythe third functional block 430 needs to operate for that purpose, and atwhich source voltage a source voltage needs to be set for the thirdfunctional block 430 to operate at that operating frequency, informationconcerning from what time, with what ability to do a work and what workvolume of the work the fourth functional block 440 needs to carry out,at which frequency the fourth functional block 440 needs to operate forthat purpose, and at which source voltage a source voltage needs to beset for the fourth functional block 440 to operate at that operatingfrequency and information concerning from what time, with what abilityto do a work and what work volume of the work the fifth functional block450 needs to carry out, at which frequency the fifth functional block450 needs to operate for that purpose, and at which source voltage asource voltage needs to be set for the fifth functional block 450 tooperate at that operating frequency.

The source voltages of the first functional block 410, the secondfunctional block 420, the third functional block 430, the fourthfunctional block 440 and the fifth functional block 450 are generated inthe incorporated power regulator 481. For the functional blocksrespectively, the power cable 482 is wired to the first functional block410, the power cable 483 is wired to the second functional block 420,the power cable 484 is wired to the third functional block 430, thepower cable 485 is wired to the fourth functional block 440 and thepower cable 486 is wired to the fifth functional block 450,respectively.

FIG. 5 is a diagram showing a connection of the inner memory 412 in thefirst functional block 410. FIG. 6 is a diagram showing a connection ofthe second inner memory 422 in the second functional block 420.

In FIG. 5, reference numeral 412 designates the inner memory provided inthe first functional block 410. Reference numeral 491A designates a chipselect signal, reference numeral 492A designates an output enablesignal, reference numeral 493A designates a read/write signal, referencenumeral 494A designates an address signal, reference numeral 495Adesignates a data signal and reference numeral 496A designates a localbus. Reference numeral 414 designates the first system clock supplied tothe circuit in the first functional block 410. Reference numeral 424designates the second system clock supplied to the circuit in the secondfunctional block 420. Reference numeral 434 designates the third systemclock supplied to the circuit in the third functional block 430.Reference numeral 444 designates the fourth system clock supplied to thecircuit in the fourth functional block 440. Reference numeral 454designates the fifth system clock supplied to the circuit in the fifthfunctional block 450. Reference numeral 413 designates the selector.Reference numeral 497A designates a control signal of the selector 413.Reference numeral 498A designates any of the system clock signals of thefirst system clock 414 supplied to the circuit in the first functionalblock 410, the second system clock 424 supplied to the circuit in thesecond functional block 420, the third system clock 434 supplied to thecircuit in the third functional block 430, the fourth system clock 444supplied to the circuit in the fourth functional block 440, and thefifth system clock 454 supplied to the circuit in the fifth functionalblock 450.

Further, in FIG. 6, reference numeral 422 designates the inner memoryprovided in the second functional block 420. Reference numeral 491Bdesignates a chip select signal, reference numeral 492B designates anoutput enable signal, reference numeral 493B designates a read/writesignal, reference numeral 494B designates an address signal, referencenumeral 495B designates a data signal and reference numeral 496Bdesignates a local bus. Reference numeral 414 designates the firstsystem clock supplied to the circuit in the first functional block 410.Reference numeral 424 designates the second system clock supplied to thecircuit in the second functional block 420. Reference numeral 434designates the third system clock supplied to the circuit in the thirdfunctional block 430. Reference numeral 444 designates the fourth systemclock supplied to the circuit in the fourth functional block 440.Reference numeral 454 designates the fifth system clock supplied to thecircuit in the fifth functional block 450. Reference numeral 423designates the selector. Reference numeral 497B designates a controlsignal of the selector 423. Reference numeral 498B designates any of thesystem clock signals of the first system clock 414 supplied to thecircuit in the first functional block 410, the second system clock 424supplied to the circuit in the second functional block 420, the thirdsystem clock 434 supplied to the circuit in the third functional block430, the fourth system clock 444 supplied to the circuit in the fourthfunctional block 440, and the fifth system clock 454 supplied to thecircuit in the fifth functional block 450.

[Operation for Writing Data Signal in First Functional Block 410 inInner Memory 422 in Second Functional Block 420]

When the first functional block 410 takes the initiative to write thedata signal in the first functional block 410 in the inner memory 422 inthe second functional block 420, after the first functional blockrecognizes that the inner memory 422 in the second functional block 420is not used by the circuit in the second functional block 420, the firstfunctional block controls the control signal 497B (see FIG. 6) of theselector 423 to set the system clock 498B to be the first system clock(f_(CLK) 1)414 supplied to the circuit in the first functional block410. Then, the first functional block sets the chip select signal 491Bto “H”, the read/write signal 493B to a “write state” and the addresssignal 494B to the address of the inner memory 422 in the secondfunctional block 420, controls the bus bridge 471 and the bus bridge 472to transmit the data signal 495A in the first functional block 410 tothe data signal 495B of the inner memory 422 in the second functionalblock 420 via the local bus 461, the global bus 466 and the local bus462, and then, writes the data signal 495B in the inner memory 422 inthe functional block 420.

[Operation for Reading Data Signal in Inner Memory 422 in SecondFunctional Block 420 to Inner Memory 412 in First Functional Block 410]

When the first functional block 410 takes the initiative to read thedata signal in the inner memory 422 in the second functional block 420to the first functional block 410, after the first functional blockrecognizes that the inner memory 422 in the second functional block 420is not used by the circuit in the second functional block 420, the firstfunctional block controls the control signal 497A (see FIG. 5) of theselector 413 to set the first system clock 414 supplied to the circuitin the first functional block 410 to be selected by the system clock498A. Then, the first functional block sets the chip select signal 491Ato “H”, the read/write signal 493A to a “read state” and the address494A of the inner memory 422 in the second functional block 420 to anaddress of an area desired to be read and controls the bus bridge 472and the bus bridge 471 to read the data signal stored in the innermemory 422 in the second functional block 420 to the first functionalblock 410 via the local bus 462, the global bus 466 and the local bus461.

Further, when the first functional block 410 takes the initiative towrite the data signal in the second functional block 420 in the innermemory 412 inn the first functional block 410 or to read the data signalin the inner memory 412 in the first functional block 410 to the secondfunctional block 420, the operation can be realized in the same manneras described above.

In the above-description, the operations are explained for writing andreading the data between the first functional block 410 and the secondfunctional block 420. Further, operations can be similarly realized forwriting and reading data between the first functional block 410, thesecond functional block 420, the third functional block 430, the fourthfunctional block 440 and the fifth functional block 450. However, inthis embodiment, since the first functional block 410 is supposed to bethe general-purpose CPU and other functional blocks than the firstfunctional block 410 including the second functional block 420, thethird functional block 430, the fourth functional block 440 and thefifth functional block 450 are supposed to be multifunction DSPs, inthis embodiment, the general-purpose CPU that is the first functionalblock 410 manages the operation of the entire operation of thesemiconductor integrated circuit 300 to the last. Accordingly, when thedata is written and read between the first functional block 410, thesecond functional block 420, the third functional block 430, the fourthfunctional block 440 and the fifth functional block 450, the secondfunctional block 420, the third functional block 430, the fourthfunctional b lock 440 and the fifth functional block 450 basically writeand read the data between them in accordance with the instruction of thefirst functional block 410 as the general-purpose CPU under the controlof the first functional block 410 as the general-purpose CPU.

FIG. 7 is a diagram showing a dependence of the work volume of thesecond functional block 420 and the source voltage (operating frequency)of the second functional block 420 on the elapse of time. Further, FIG.8 is a diagram showing a dependence of the work volume of the firstfunctional block 410 and the source voltage (operating frequency) of thefirst functional block 410 on the elapse of time.

As shown, in examples of the work volume of the second functional block420 in FIG. 7( a) and the operating source voltage of the secondfunctional block 420 in FIG. 7( b), a schedule of works is managed bythe first functional block 410 as the general-purpose CPU that thesecond functional block 420 carries out a work 21 during time from t0 tot1 under the source voltage VDD 21 and the operating frequency f_(CLK)21, a work 22 during time from t1 to t2 under the source voltage VDD 22and the operating frequency f_(CLK) 22, a work 23 during time from t2 tot3 under the source voltage VDD 23 and the operating frequency f_(CLK)23 and a work 24 during time from t3 to t4 under the source voltage VDD24 and the operating frequency f_(CLK) 24.

As shown in examples of the work volume of the first functional block410 in FIG. 8( a) and the operating source voltage of the firstfunctional block 410 in FIG. 8( b), a schedule of works is managed bythe first functional block 410 itself that the first functional block410 carries out a work 11 during time from t0 to t1 under the sourcevoltage VDD 11 and the operating frequency f_(CLK) 11, a work 12 duringtime from t1 to t2 under the source voltage VDD 12 and the operatingfrequency f_(CLK) 12 and a work 13 during time from t2 to t3 under thesource voltage VDD 13 and the operating frequency f_(CLK) 13.

As can be understood by comparing FIG. 7 with FIG. 8, the frequency ofthe first system clock 414 generated in the first clock generatingcircuit 411 in the first functional block 410 and supplied to thecircuit in the first functional block 410 is determined depending on thecalculation throughput of the work carried out in the first functionalblock 410. The frequency of the second system clock 424 generated in thesecond clock generating circuit 421 in the second functional block 420and supplied to the circuit in the second functional block 420 isdetermined depending on the calculation throughput of the work carriedout in the second functional block 420. Accordingly, a definitecorrelation does not exist between the frequency of the first systemclock 414 generated in the first clock generating circuit 411 in thefirst functional block 410 and supplied to the circuit in the firstfunctional block 410 and the frequency of the second system clock 424generated in the second clock generating circuit 421 in the secondfunctional block 420 and supplied to the circuit in the secondfunctional block 420.

FIG. 9 is a block diagram showing the structure of the second clockgenerating circuit 421 in the second functional block 420.

In FIG. 9, the second clock generating circuit 421 includes a phasedetector 381 for comparing the phase of the system clock 353 generatedin the clock generating circuit 352 with the phase of an output of afrequency dividing circuit, a loop filter 382, a VCO (Voltage ControlledOscillator) 383, and a frequency dividing circuit 384A for dividing thefrequency of an output signal from the VCO 383 into a frequencymultiplied by N/M (in this case, M>N). Further, reference numeral 385Adesignates a control signal from the first functional block 410 supposedto be the general-purpose CPU. Reference numeral 424 designates thesecond system clock (f_(CLK) 2) generated in the second clock generatingcircuit 421 in the second functional block 420.

The second clock generating circuit 421 forms a PLL (Phase-Locked Loop)circuit 386 and generates the second system clock 424 synchronizing withthe system clock 353 generated in the clock generating circuit 352.Further, the operating frequency of the second system clock 424 can beset to a frequency desired by the control signal 385A from the firstfunctional block 410 supposed to be the general-purpose CPU. Forinstance, assuming that the frequency of the system clock 353 generatedin the clock generating circuit 352 is f_(CLK-353), the frequency of thesecond system clock 424 synchronizing with the system clock 353generated in the clock generating circuit 352 is f_(CLK-424), and thefrequency dividing ratio of the frequency of the output signal from theVCO 383 set by the control signal 385A from the first functional block410 supposed to be the general-purpose CPU is N/M, a below-describedrelation is established.f _(CLK-424) ×N/M=f _(CLK-353)  (1)

Accordingly, a relation off _(CLK-424) =f _(CLK-353) ×M/N  (2)is established.

By the above-described method, the system clock 424 generated in thesecond clock generating circuit 421 that is synchronous with the systemclock 353 generated in the clock generating circuit 352 can be freelycontrolled by the control signal 385A from the first functional block410 supposed to be the general-purpose CPU.

FIG. 10 is a block diagram showing the structure of the first clockgenerating circuit 411 in the first functional block 410. The samecomponents as those of FIG. 9 are designated by the same referencenumerals.

The first clock generating circuit 411 has the same structure as that ofthe second clock generating circuit 421 except that a control signal385B from the first functional block 410 in the second clock generatingcircuit 421 is a signal from the first functional block 410 itself.

The above-mentioned relations are summarized as follows. In the firstclock generating circuit 411 provided in the first functional block 410,the first system clock 414 necessary for the first functional block 410to carry out the work whose throughput changes depending on the time isgenerated from the system clock generating circuit 353 of thesemiconductor integrated circuit 300 by using the first clock generatingcircuit 411. In the second clock generating circuit 421 provided in thesecond functional block 420, the second system clock 424 necessary forthe second functional block 420 to carry out the work whose throughputchanges depending on the time is generated from the system clockgenerating circuit 353 of the semiconductor integrated circuit 300 byusing the second clock generating circuit 421.

The first functional block 410 as the general-purpose CPU has the firstinner memory 412 of a large capacity. The first functional block 410generally manages the entire operation of the semiconductor integratedcircuit 300. In this embodiment, the first functional block 410 has aspecific schedule about in what sequence and what work the secondfunctional block 420 carries out in the inner memory 412 of the largecapacity in the form of a program. Further, the first functional block410 has information concerning from what time, with what ability to do awork and what work volume of the work the second functional block 420needs to carry out, during a process for executing the program, at whichfrequency the second functional block 420 needs to operate for thatpurpose, and under which source voltage the second functional block 420needs to operate at that operating frequency.

Now, how the first functional block 410 controls the source voltage andthe operating frequency of the second functional block 420 will bespecifically described below.

What work the second functional block 420 carries out is described inthe inner memory 412 of the first functional block 410 in the form of anoperating program. The first functional block 410 reads that the secondfunctional block 420 carries out the work 21 from the time t0 (see FIG.7) in accordance with the operating program. Then, the first functionalblock 410 reads the source voltage VDD 21, the operating frequencyf_(CLK) 21 and M/N described in the equation (2) that are suitable forthe work 21 from Table 5 stored in a specific area different from theoperating program.

TABLE 5 Contents of Operating work Source voltage frequency M/N Work 11VDD 11 f_(LCK) 11 3 Work 12 VDD 12 F_(LCK) 12 5 Work 13 VDD 13 f_(LCK)13 2 Work 14 VDD 14 f_(LCK) 14 2 Work 15 VDD 15 f_(LCK) 15 2 Work 16 VDD16 f_(LCK) 16 5 Work 17 VDD 17 f_(LCK) 17 3 Work 18 VDD 18 f_(LCK) 18 7Work 19 VDD 19 f_(LCK) 19 6 Work 21 VDD 21 f_(LCK) 21 15 Work 22 VDD 22f_(LCK) 22 9 Work 23 VDD 23 f_(LCK) 23 13 Work 24 VDD 24 f_(LCK) 24 7Work 25 VDD 25 f_(LCK) 25 21 Work 26 VDD 26 f_(LCK) 26 8 Work 27 VDD 27f_(LCK) 27 18 Work 28 VDD 28 f_(LCK) 28 7 Work 29 VDD 29 f_(LCK) 29 11

This Table 5 is determined by previously investigating respectively thecontents of the works described in the operating program and inaccordance with a minute and careful simulation about which frequenciesare necessary and to which source voltages the source voltage needs tobe set for that when the multifunction DSP of the second functionalblock 420 is allowed to carry out the works respectively.

Then, the first functional block 410 initially instructs theincorporated power regulator 481 to supply the source voltage VDD 2 tothe second functional block 420.

Then, the first functional block 410 writes a proper specific value ofM/N in the circuit for dividing the frequency of the output signal fromthe VCO 383 of the second clock generating circuit 421 into a frequencymultiplied by N/M (in this case, M>N) through the control signal 385shown in FIG. 9. The second clock generating circuit 421 is set to thestable operating frequency f_(CLK) 2 after the elapse of a set-up timeof the PLL circuit 386. Since a time necessary for the above-describedsetting operation is less than a time necessary for the work 21, thetime is not shown in FIG. 7.

After the elapse of a time necessary for obtaining the stable sourcevoltage VDD 2 and the operating frequency f_(CLK) 2 of the secondfunctional block 420, since the first functional block 410 permits thesecond functional block 420 to start the work 21, the second functionalblock 420 starts the work 21.

When the second functional block 420 completes the work 21, the secondfunctional block 420 reports “information of the completion of the work21” to the first functional block 410 that manages all the works. Amethod may be, of course, used that when the second functional block 420completes the work 21, in place of reporting the “information of thecompletion of the work 21” to the first functional block 410 managingall the works, the second functional block 420 records the “informationof the completion of the work 21” in a specific register as a flag andthe first functional block 410 watches the register.

In the above-description, for the multifunction DSP, to what sourcevoltage the source voltage is set and to what operating frequency theoperating frequency is set correspondingly to the contents of the worksrespectively are determined by the previous minute and carefulsimulation. When the operating frequency is supposed to be constantduring carrying out a certain work, to provide a margin in the operationof the multifunction DSP, a margin needs to be provided in the value ofthe operating source voltage. At this time, two points need to be mainlytaken into consideration.

-   (1) Unevenness of Delay Path-   (2) Secured Temperature Range

Initially, an unevenness of delay paths will be described below. Whenthe inner circuit of the block of each multifunction DSP is examined, aswill be described in FIG. 11, the delay paths in this circuit havevarious values. The value of the source voltage necessary for carryingout a specific work in the multifunction DSP is determined by a group ofthe delay paths referred to as a critical path among the various delaypaths existing in the functional block. Accordingly, the source voltagesof all inner circuits of the block of the multifunction DSP do not needto be raised. As shown in FIG. 1, it is effective from the viewpoint ofreducing a consumed electric power to raise only the source voltage VDDH151 of the combined circuit 104 forming the critical path. Further, inthe critical path, since the value of the source voltage VDDH 151required for ensuring a certain delay margin is also different dependingon a degree of delay, it is advantageous to set required valuesrespectively. Since it is of course undesirable to generate too manysource voltage values in the power regulator shown in FIG. 4, the sourcevoltage value VDDH supplied to the combined circuit 104 of the criticalpath is set to five stages of a source voltage value VDDH-lowlow, asource voltage value VDDH-low, a source voltage value VDDH-normal, asource voltage value VDDH-high and a source voltage value VDDH-highhigh,as shown in FIG. 3, and preferably set to six source voltage valuesincluding the source voltage value VDDL supplied to other parts than thecombined circuit 104 of the critical path.

Now, a secured temperature range will be described below. In asemiconductor technology of a deep sub-micron area, it has beendifficult to design a semiconductor integrated circuit that has usuallyconsidered the worst case. The circuit using the canary FF shown in FIG.18 is one example of a structure that makes it possible to design notthe semiconductor integrated circuit considering the worst case, but theintegrated circuit in a typical case. This method improves a method by aRazor circuit formerly devised, however, has the problems as describedin the problem 1 and the problem 2. The first embodiment and the secondembodiment shown in FIG. 1 and FIG. 2 more improve the usual method bythe canary FF and show the structures that can realize a required designmargin of the semiconductor integrated circuit as small as possible. Theabove-described structures can effectively reduce the consumed electricpower.

A part enclosed by a black thick frame in FIG. 3 shows a part of thepower regulator 481 illustrated in FIG. 4. The power cables 202, 203,204, 205 and 206 of the source voltage value VDDH-lowlow, the sourcevoltage value VDDH-low, the source voltage value VDDH-normal, the sourcevoltage value VDDH-high and the source voltage value VDDH-highhigh shownin FIG. 3 and the switch part 207 for switching the source voltage valueVDDH supplied to the level shifter 152 and the combined circuit 104 inaccordance with the combination of the value of the compared resultsignal 110, the value of the compared result signal 114, the value ofthe compared result signal 118 and the value of the compared resultsignal 122 as shown in the Table 3 and the Table 4 may be respectivelylaid out in the vicinity of the critical paths or in a suitable positionof the multifunction block and can be designed to be concentricallymanaged together in one place of the semiconductor integrated circuit.

For instance, from the power regulator 481 shown in FIG. 4, the sourcevoltages VDDL and VDDH can be supplied to the first functional block 410by wiring the power cable 482, to the second functional block 420 bywiring the power cable 483, to the third functional block 430 by wiringthe power cable 484, to the fourth functional block 440 by wiring thepower cable 485, and to the fifth functional block 450 by wiring thepower cable 486.

When the circuit enclosed by the thick frame shown in FIG. 3 is laid outin the vicinity of the critical paths respectively, a plurality of powercables need to be respectively wired from the power regulator 481 shownin FIG. 4 to parts near the critical paths. In this case, the number ofthe power cables to be wired needs to be reduced as small as possible inview of a space. Thus, a below-described contrivance is made.

In FIG. 11, a value of path delay in the source voltage value VDDL inthe multifunction DSP block is shown in an axis of abscissas and thecorresponding count number of the value of path delay is shown in anaxis of ordinates. In FIG. 11, a delay time determined by a clockfrequency supplied to the multifunction DSP block is shown by a verticalline in FIG. 11. When the value of path delay is larger than the timeshown by the vertical line in FIG. 11, the critical path is formed, andthe source voltage value VDDH having a value higher than the sourcevoltage value VDDL to the combined circuit 104 of the critical path toreduce a delay time. In this case, since the source voltage value VDDHsupplied to the combined circuit 104 of the critical path is higher thanthe source voltage value VDDL supplied to the flip-flop 103, the levelshifter 152 is inserted between the flip-flop 103 and the combinedcircuit 104.

As can be understood from FIG. 11, the critical path has a difference inthe value of path delay, so that the difference of about three stages issupposed to exist depending on the strictness of the delay time so thatthe strictness is met. Accordingly, the source voltages VDDH supplied tothe combined circuit 104 of the critical path is supposed to have thefive stages of voltages including the source voltage value VDDH-lowlow,the source voltage value VDDH-low, the source voltage value VDDH-normal,the source voltage value VDDH-high and the source voltage valueVDDH-highhigh. As specific values, for instance, the values of thesource voltage value VDDL, the source voltage value VDDH-lowlow, thesource voltage value VDDH-low, the source voltage value VDDH-normal, thesource voltage value VDDH-high and the source voltage valueVDDH-highhigh are respectively 1.0 V, 1.10 V, 1.15 V, 1.20 V, 1.25 V and1.30 V.

Repeatedly described, the critical path has a difference in the value ofpath delay. To the critical path whose degree of delay is low, the threestages of voltages including the source voltage value VDDH-lowlow, thesource voltage value VDDH-low and the source voltage value VDDH-normalcan be set so as to select. To the critical path whose degree of delayis intermediate, the three stages of voltages including the sourcevoltage value VDDH-low, the source voltage value VDDH-normal and thesource voltage value VDDH-high can be set so as to select. To thecritical path whose degree of delay is high, the three stages ofvoltages including the source voltage value VDDH-normal, the sourcevoltage value VDDH-high and the source voltage value VDDH-highhigh canbe set so as to select. In FIG. 12, FIG. 13 and FIG. 14, theabove-described cases are respectively shown. Since the source voltagevalue VDDH includes the three-stages of voltages in the critical pathsrespectively, the two canary FFs as shown in FIG. 1 are adequatelyprovided.

As an initial value, intermediate source potentials in the respectivecases are designed so as to obtain the case of (2) in the Table 2.Specifically, for the critical path whose degree of delay is low, theinitial value of the source voltage value VDDH is designed to be set tothe source voltage value VDDH-low. For the critical path whose degree ofdelay is intermediate, the initial value of the source voltage valueVDDH is designed to be set to the source voltage value VDDH-normal. Forthe critical path whose degree of delay is high, the initial value ofthe source voltage value VDDH is designed to be set to the sourcevoltage value VDDH-high.

For instance, in a certain critical path, the degree of delay of thecritical path is supposed to be intermediate and the source voltagevalue VDDH is supposed to be designed to have the case of (2) in theTable 2. However, actually, the case of (1) in the Table 2 is supposedto be obtained. At this time, since the value of the compared resultsignal 110 is “1” and the value of the compared result signal 114 is“1”, a control operates so as to “raise the source voltage value VDDH”.Thus, the source voltage value VDDH is changed to the source voltagevalue VDDH-high from the source voltage value VDDH-normal set as theinitial value.

Similarly, in a certain critical path, the degree of delay of thecritical path is supposed to be intermediate and the source voltagevalue VDDH is supposed to be designed to have the case of (2) in theTable 2. However, actually, the case of (3) in the Table 2 is supposedto be obtained. At this time, since the value of the compared resultsignal 110 is “0” and the value of the compared result signal 114 is“0”, a control operates so as to “lower the source voltage value VDDH”.Thus, the source voltage value VDDH is changed to the source voltagevalue VDDH-low from the source voltage value VDDH-normal set as theinitial value. Whatever causes exist that generate the delay of thecritical path, the structure of the present invention includes afunction for automatically adjust a margin of the delay of the criticalpath to a prescribed value.

When the consumed electric power in the work of the multifunction DSP istried to be reduced, the source voltage value of the multifunction DSPto be set may be set to the lowest value that can pass at all costs thecritical path whose delay value is the largest. However, it is verydifficult to determine such a subtle setting even by a previous minuteand careful simulation.

A plurality of canary FFs are used respectively for the critical paths.Thus, it can be recognized whether a delay margin in a present circuitis lower, proper or higher relative to a desired value. This informationis used for controlling respectively the source voltages of the combinedcircuits of the critical paths to be “raised”, “held” and “lowered”, sothat the DVS (Dynamic Voltage Scaling) technique and the AVS (AdaptiveVoltage Scaling) technique suitable for reducing the consumed electricpower can be realized.

The above-description merely exemplifies the preferred embodiments ofthe present invention and a scope of the present invention is notlimited thereto.

In the above-mentioned third embodiment, one example of thesemiconductor integrated circuit is described that utilizes the firstembodiment or the second embodiment of the present invention. However,the semiconductor integrated circuit utilizing the first embodiment orthe second embodiment of the present invention is not limited to thethird embodiment.

For instance, in the third embodiment, all of the second functionalblock to the fifth functional block are defined as the “multifunctionDSPs”. However, a certain functional block mainly carries out only aprocess of a calculation and may not sometimes correspond to a generallycalled “DSP”.

Further, as the functional block supposed to be the “multifunction blockDSP”, a description is given to a case having the four functional blocksof the second functional block to the fifth functional block. However,it is to be understood that the number is not limited to four.

The semiconductor integrated circuit according to the present inventionis effectively employed for reducing the consumed electric power of thesemiconductor integrated circuit using the AVS (Adaptive VoltageScaling) technique or the DVS (Dynamic Voltage Scaling) technique.

1. A semiconductor integrated circuit, having a critical path, thesemiconductor integrated circuit comprising: a first flip-flop, acombined circuit and a second flip-flop that are connected in series andform the critical path; a first delay circuit and a third flip-flopconnected in series that are provided in parallel with the secondflip-flop in the post-stage of the combined circuit; a second delaycircuit and a fourth flip-flop connected in series that are provided inparallel with the second flip-flop in the post-stage of the combinedcircuit; a first comparison circuit that compares the output of thesecond flip-flop with the output of the third flip-flop; a secondcomparison circuit that compares the output of the second flip-flop withthe output of the fourth flip-flop: and a control circuit that controlsa source voltage supplied to the combined circuit in accordance with theoutput of the first comparison circuit and the output of the secondcomparison circuit, wherein the first delay circuit outputs a signalinputted from the combined circuit after a first delay time and thesecond delay circuit outputs a signal inputted from the combined circuitafter a second delay time different from the first delay time.
 2. Thesemiconductor integrated circuit according to claim 1, wherein the firstdelay time is a value 5% to 30% as long as a delay time from the firstflip-flop to the second flip-flop.
 3. The semiconductor integratedcircuit according to claim 2, wherein the second delay time is a value105% to 130% as long as the first delay time.
 4. The semiconductorintegrated circuit according to claim 1, wherein when the output of thefirst comparison circuit shows a “mismatch” of two input signals and theoutput of the second comparison circuit shows a “mismatch” of two inputsignals, the control circuit controls the source voltage supplied to thecombined circuit to be raised.
 5. The semiconductor integrated circuitaccording to claim 1, when the output of the first comparison circuitshows a “match” of the two input signals and the output of the secondcomparison circuit shows a “mismatch” of the two input signals, thecontrol circuit controls the source voltage supplied to the combinedcircuit to be held.
 6. The semiconductor integrated circuit according toclaim 1, when the output of the first comparison circuit shows a “match”of the two input signals and the output of the second comparison circuitshows a “match” of the two input signals, the control circuit controlsthe source voltage supplied to the combined circuit to be lowered. 7.The semiconductor integrated circuit according to claim 1, wherein anequal source voltage is supplied to the first flip-flop and the secondflip flop and the source voltage is lower than the source voltagesupplied to the combined circuit.
 8. The semiconductor integratedcircuit according to claim 1, wherein the control circuit controls thesource voltage supplied to the combined circuit to be “raised”, “held or“lowered”.
 9. The semiconductor integrated circuit according to claim 8,wherein the control circuit sets the initialization of the sourcevoltage supplied to the combined circuit to be “held”.
 10. Thesemiconductor integrated circuit according to claim 1, furthercomprising: a third delay circuit and a fifth flip-flop connected inseries that are provided in parallel with the second flip-flop in thepost-stage of the combined circuit; a fourth delay circuit and a sixthflip-flop connected in series that are provided in parallel with thesecond flip-flop in the post-stage of the combined circuit; a thirdcomparison circuit that compares the output of the second flip-flop withthe output of the fifth flip-flop; and a fourth comparison circuit thatcompares the output of the second flip-flop with the output of the sixthflip-flop: wherein the control circuit controls the source voltagesupplied to the combined circuit in accordance with the output of thefirst comparison circuit, the output of the second comparison circuit,the output of the third comparison circuit and the output of the fourthcomparison circuit and the first delay time, the second delay time, athird delay time by the third delay circuit and a fourth delay time bythe fourth delay circuit are respectively different.